X-ray Diffractometer (XRD)

Empyrean, Malvern Panalytical

The Empyrean Series III Diffractometer is the first intelligent,multipurpose diffractometer with innovative features which allows the largest variety of measurements.
The Bragg-Brentano High Definition High Intensity Incident Beam Optics is a unique optical module from Malvern Panalytical analysis of Powder, Nano Material & Thin Film without any change over
Bragg-Brentano HD is a Special Unique
incident beam optic offering from us for Bragg-Brentano Focusing Geometry & parallel Beam Geometry measurements with an energy resolution of about 450 eV with the high speed detector offered, replacing the incident beam Ni Beta-filter With improved peak-to-background ratio and better low angle
performances.

X-Ray sources: Cu Kα (λ = 1.54 Å) (default)

Techniques

Rapid powder X-ray diffraction (PXRD): Powder XRD done at standard angular resolutions is rapid and gives precise data with high intensity peaks. Very high angular resolution scans are also possible. Sample type: powder, metallic, thin films, liquid and polymer samples
Grazing incidence X-ray diffraction (GIXRD) : or thin films: Grazing incidence x-ray diffraction is used to analyse specifically thin crystalline films (20-200nm depending on mean atomic number) on polished, flat surfaces. It is possible to deal with multiple films to a limited extent
2D scan to view the diffraction patterns in two dimensional texture analysis using pole figures for metallic samples

Software packages available in our facility

Data collector(to collect the XRD spectrum data)
Data viewer (to visualize the XRD spectrum data)
X’Pert Highscoreplus(processing of XRD spectrum, Profile fitting, Williamson Hall plots and Rietveld refinements)
X’pert texture (for texture analysis using pole diagrams)
XRD 2D scan (to visualize the patterns in 2D)
ICDD PDF-2 (Crystallographic database)

Contact

Who Can Use This Facility?

Booking & Usage

Operating Hours: Monday to Friday, 9:00 AM – 5:00 PM
Booking: Prior appointment required
Charges: Nominal analysis fee applicable (Download latest [fee structure PDF])