Multimode Scanning Probe Microscopy (AFM/STM) Facility
Multimode Scanning Probe Microscopy (AFM/STM)
The instrument is capable of performing multimode operations especially for analyzing surface characteristics with high precision and resolution. It is possible to carry out experiments in air, vacuum as well as in liquids in controlled environment. The added new generation electronics provides operations even in high-frequency modes.
AFM Imaging: Contact / Semi contact mode
- Scanning Tunneling Microscopy (STM)
- Lateral Force Microscopy (LFM)
- Phase Imaging, Force Modulation
- Magnetic Force Microscopy (MFM)
- Electrostatic Force Microscopy (EFM)
- Spreading Resistance Imaging (SRI)
- Scanning Capacitance Imaging (SCI)
- Scanning Kelvin Probe Microscopy (SKM)
- Heating Stage Operations
- Adhesion Force Imaging
- AFM Nanolithography
- Nanosclerometry with AFM-Nanoindentation
In Liquid
- Contact AFM/LFM/Adhesion Force Imaging/Force Modulation, Phase Imaging
- AFM Nanolithography
- Electrochemical AFM/STM Imaging
Bench-top Scanning Probe Microscope AFM/STM (Nanosurf)
Nanosurf AFM and STM is user friendly, compact instrument used for surface characterization of nano and microscale materials in material science and life science disciplines which supports
- Contact mode AFM imaging
- STM imaging
Contact
For Admission to PSG IAS
- Dr. K K Venkataraman
- Mail : kkv@psgias.ac.in
Who Can Use This Facility?
- University researchers
- Industrial R&D teams
- Independent scientists
- Startups and material science innovators
Booking & Usage
Operating Hours: Monday to Friday, 9:00 AM – 5:00 PM
Booking: Prior appointment required
Charges: Nominal analysis fee applicable (Download latest [fee structure PDF])
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