Environmental Scanning Electron Microscope

Environmental Scanning Electron Microscope

Scanning electron microscopy (EVO 18) with cryo facility for sensitive samples

Scanning electron microscope (SEM) is a non-destructive technique that uses an electron beam to analyze surface details down to nano-scale. PSGIAS has EVO 18 model with low vacuum facility and ALTO 1000 cryo attachment for biological, hydroscopic and sensitive samples.

Contact

Who Can Use This Facility?

Booking & Usage

  • Operating Hours: Monday to Friday, 9:00 AM – 5:00 PM

  • Booking: Prior appointment required

  • Charges: Nominal analysis fee applicable (Download latest [fee structure PDF])