Environmental Scanning Electron Microscope

Environmental Scanning Electron Microscope
Scanning electron microscopy (EVO 18) with cryo facility for sensitive samples
Scanning electron microscope (SEM) is a non-destructive technique that uses an electron beam to analyze surface details down to nano-scale. PSGIAS has EVO 18 model with low vacuum facility and ALTO 1000 cryo attachment for biological, hydroscopic and sensitive samples.
Contact
- Dr. Anuradha M Ashok
- Mail : anu@psgias.ac.in
- Contact : + 91 – 422 – 434 4000, EXTN : 4321
Who Can Use This Facility?
- University researchers
- Industrial R&D teams
- Independent scientists
- Startups and material science innovators
Booking & Usage
Operating Hours: Monday to Friday, 9:00 AM – 5:00 PM
Booking: Prior appointment required
Charges: Nominal analysis fee applicable (Download latest [fee structure PDF])